SN54ABT18245A devices equivalent, scan test devices.
of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Wideb.
The ’ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex c.
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